Advanced Semiconductor Process Chemicals
          (Intermediate process, post-process)

Chemicals lineup by semiconductor semi-additive process

Several photolithographic processes are used in the semiconductor manufacturing process. Typical examples are processes using dry etching and plating. Below are examples of semi-additive (SAP) processes that use plating, as well as examples of strippers and etchants used in the processes.

Ti/Cu deposition
Ti/Cu deposition
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Photoresist
patterning (decasm)
Photoresist patterning (decasm)
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metal plating
metal plating
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Photoresist Stripping
Photoresist Stripping

N-SC Series

N-SC Series

High dissolution and removability for DFR and low damage (Cu, SnAg, PI, MC etc.)

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Cu seed layer etching
Cu seed layer etching

N-CE Series

N-CE Series
  • ・ Uniform etching property
  • ・ Low CD loss
  • ・ long bath life
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Ti barrier layer etching
Ti barrier layer etching

N-TE Series (Inquiry required)

N-TE Series (Inquiry required)
  • ・ Uniform etching property
  • ・ Low CD loss
  • ・ long bath life

Please inquire about chemical solutions for front-end processes (e.g., stripper, pad cleaning solution, etchant, etc.) and other chemicals. (Including products in development stage)

Stripper for Dry film photoresist N-SC238

N-SC238 is a dry film type negative resist stripper used for Cu plating process, etc.

Stripper for Dry film photoresist N-SC238

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    Excellent negative resist removability

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    Dissolves negative resist and prevents substrate adhesion and filter clogging

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    Long bath life

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    Less damage to Cu, Ti, polyimide, etc.

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    Can be rinsed directly after removal

Process example

N-SC238 40~70℃
Dip or Shower
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DIW room temperature 1~5min
Dip or Shower
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DRY Blow

Example of removing

initial
initial
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after processing
after processing
70℃/60min

Notes.

Please read the SDS before use.

Cu etchant N-CE1

N-CE1 is an etchant for Cu seed in the plating process. It does not contain hydrogen peroxide and is extremely stable.

About N-CE series / Cu Etchant

About N-CE series / Cu Etchant

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    Hydrogen peroxide free

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    Excellent elapsed time stability

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    Not containing PTRT, PFOS, PFOS applicable substances

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    Non-toxic, non-hazardous materials

Application example
(Cu Redistribution Layer, RDL)

Application example (Cu Redistribution Layer, RDL)
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Application example (Cu Redistribution Layer, RDL)
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Application example (Cu Redistribution Layer, RDL)

Example of processing conditions

N-CE1 room temperature ~50°C
Shower or Dip
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DIW room temperature 1~5min
Shower
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DRY SRD

Basic performance

Cu Ti
Etching rate
(40°C)
25 <1
(nm/min)